Abstract
We have performed the Monte Carlo simulation of electromigration noise in polycrystalline metal stripes, based on a two-dimensional model which takes into account both the role of grain boundaries and the effect of current density redistribution in the stripe. The noise spectrum has the characteristic 1/ f γ ( γ≈2) behavior, and the total noise power strongly increases with increasing damage of the stripe. The results of the simulation exhibit a substantial qualitative agreement with experiments, giving confidence in the capability of our model of including the relevant physics involved in the failure process.
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