Abstract

In this paper, a fast simulation of the electromagnetic wave propagation in negative index materials is developed by the localized meshfree radial basis function (RBF) collocation method. The perfect match layer is considered on the boundary in a unit cell to avoid the wave reflection. The experienced shape parameter is validated by simple test functions. The CPU time costs are compared with those of FEM. Numerical examples of different scatterers are presented to demonstrate the efficiency of the proposed method.

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