Abstract
A recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation code for calculating and evaluating surface structures) has been extended to incorporate the molecular dynamics method. Using this ACCESS-II, LFM (lateral force microscopy) as well as AFM simulations were performed under dynamic conditions. Lateral forces felt by the tip exhibited a behavior that leads to the typical stick-slip phenomenon, and their magnitudes are close to that of the vertical force. The role of the lateral forces in contact-mode AFM imaging is discussed.
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