Simulation of a periodic dielectric corrugation with an equivalent anisotropic layer

Abstract

A periodic, corrugated, dielectric layer is simulated by an anisotropic dielectric layer of equal thickness. The tensor elements of the equivalent dielectric layer are given in terms of the permittivity of the dielectric material, the period of the surface corrugation, and the width of the corrugations. The validity of this technique is verified by comparing the reflection coefficient of the equivalent layer with that of the corresponding corrugated layer using the moment method. Employing a multiple layer approach, the technique is extended to handle periodic surfaces with arbitrary cross sections which can be used to design millimeter wave dielectric plate polarizers and absorbers.