Abstract
Stimulated emission depletion (STED) microscopy had greatly enhanced our ability to explore the microscopic world, which can provide sub-diffraction resolution. The high resolution of STED depends on the shape of the depletion patterns with the center is a null intensity. Optical aberrations were the most important factor which affects the shape of the depletion patterns. In this paper, the influences of aberrations modes on the performance of depletion patterns in STED microscopy were studied by numerical simulation and experiment using Zernike polynomials. Simulation results show that the coma, trefoil, astigmatism and spherical had the largest effect on depletion patterns. Also, distortion and blurring of the image will increase with multiple wavefront aberrations. Finally, the simulation results are verified by experiments based on space light modulator (SLM). The study provides a scientific basis for designing a STED system, and has important guiding significance in both theory and practice.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
