Abstract
Simulations of side-band holograms produced with a STEM equipped with a coherent, point electron source and a beam splitter are presented and interpreted. Holograms are calculated for various electron voltages, beam separations and thicknesses of GaAs [110]. The results illustrate features in a hologram associated with a stable, well-adjusted microscope. The simulations also provide data on the dynamic range and resolution necessary for recording the patterns and indicate techniques for removing from the reconstructed images interferences from unscattered beams.
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