Simulation and first characterization of MAPS test structures with gain for timing applications

Abstract

Thanks to their advantages in terms of easiness of manufacturing and reduced production costs, Monolithic Active Pixel Sensors (MAPS) represent an appealing solution for radiation imaging applications, which require to cover large areas with pixelated detectors. In the next upgrade of the ALICE detector, that will have to deal with the higher event rate resulting from the planned increase in the LHC luminosity, it is foreseen to include two additional sensor layers to perform Time of Flight (ToF) measurements. Trying to reach the challenging timing resolution required by the ALICE ToF layers, an internal gain layer has been included in the test structures of the third engineering run of the ARCADIA project to improve the timing performance of this MAPS technology. In the paper we will present an overview of the main results obtained from the electrical and the dynamic characterization of the fabricated devices, which have been compared with the behavior expected from the preliminary TCAD simulations carried out in the design phase. The experimental results confirmed the feasibility of embedding a gain layer in the ARCADIA 110 nm CMOS technology to develop monolithic LGADs.