Abstract
A variety of medical, industrial, and scientific applications requires highly sensitive and cost-effective x-ray detectors for photon energies ranging from keV to MeV. Adapting the thickness of polycrystalline or single crystal conversion layers especially to high-energy applications increases the complexity of fabrication and potentially decreases the performance of conventional direct conversion x-ray detectors. To tackle the challenges with respect to the active layer thickness and to combine the superior performance of single crystal materials with the low-cost nature of polycrystalline conversion layers, we investigate thin film x-ray detector technologies based on a folded device architecture. Analytical models simulating the sensitivity and the detective quantum efficiency (DQE) are used to evaluate the performance of folded detectors based on polycrystalline organic-inorganic perovskite semiconductors in various layout configurations and for different photon energies. Simulations of folded perovskite devices show high sensitivities. The DQE analysis introduces additional noise related boundary conditions for the folding length. A comparison with conventional detectors based on state of the art conversion materials at different photon energies demonstrates the potential of the folded detector layout as simulated sensitivities are comparable to single crystal detectors.
Highlights
A variety of medical, industrial, and scientific applications requires highly sensitive and cost-effective x-ray detectors for photon energies ranging from keV to MeV
The sensitivity in low quality poly-MAPbI3 is influenced by its poorer charge transport properties and an optimal value of d exists within the investigated interval that compromise the effect of effective filling and charge collection (see Fig. 4(b))
The sensitivity S of folded poly-MAPbI3 x-ray detectors was investigated for the case of polycrystalline layers with high and low material quality
Summary
A variety of medical, industrial, and scientific applications requires highly sensitive and cost-effective x-ray detectors for photon energies ranging from keV to MeV. Adapting the thickness of polycrystalline or single crystal conversion layers especially to high-energy applications increases the complexity of fabrication and potentially decreases the performance of conventional direct conversion x-ray detectors. To tackle the challenges with respect to the active layer thickness and to combine the superior performance of single crystal materials with the low-cost nature of polycrystalline conversion layers, we investigate thin film x-ray detector technologies based on a folded device architecture. Analytical models simulating the sensitivity and the detective quantum efficiency (DQE) are used to evaluate the performance of folded detectors based on polycrystalline organic-inorganic perovskite semiconductors in various layout configurations and for different photon energies. A comparison with conventional detectors based on state of the art conversion materials at different photon energies demonstrates the potential of the folded detector layout as simulated sensitivities are comparable to single crystal detectors. Especially in the case of compound semiconductors, the fabrication of high quality single crystals is a complex and expensive process and the crystal size is limited to several millimeters due to technological constraints
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