Abstract
A simulation method for acquiring spectrometer’s Spectral Response Function (SRF) based on Huygens Point Spread Function (PSF) is suggested. Taking into account the effects of optical aberrations and diffraction, the method can obtain the fine SRF curve and corresponding spectral bandwidth at any nominal wavelength as early as in the design phase. A prism monochromator is proposed for illustrating the simulation procedure. For comparison, a geometrical ray-tracing method is also provided, with bandwidth deviations varying from 5% at 250 nm to 25% at 2400 nm. Further comparison with reported experiments shows that the areas of the SRF profiles agree to about 1%. However, the weak scattered background light on the level of 10−4 to 10−5 observed by experiment could not be covered by this simulation. This simulation method is a useful tool for forecasting the performance of an underdesigned spectrometer.
Highlights
The spectral calibration [1, 2] of a spectrometer mainly consists of the accurate measurement of the Spectral Response Function [3, 4] (SRF, known as Instrument Function [5]), from which the peak response wavelength and the spectral bandwidth of each detection channel can be derived
Based on Huygens Point Spread Function (PSF), which is more accurate than Fast Fourier Transform (FFT) PSF, a modified simulation method for SRF and spectral bandwidth is suggested
The SRF and spectral resolution simulation method based on Huygens PSF is proposed to quantificationally characterize the spectroscopic properties of a spectrometer
Summary
The spectral calibration [1, 2] of a spectrometer mainly consists of the accurate measurement of the Spectral Response Function [3, 4] (SRF, known as Instrument Function [5]), from which the peak response wavelength and the spectral bandwidth of each detection channel can be derived. Spectral line lamp and doped diffuse panel are only used for calibrating the peak response wavelength and are more effective for linear dispersion instruments. The contour of the SRF is evaluated but it does not establish the relationship between the simulated SRF and the wavelength Some parameters such as central wavelength and spectral bandwidth are still needed. Even in the optical design phase, the simulation procedure can be carried out immediately at need to forecast the designer’s concerned specifications This simulation method takes account of the effects of optical aberrations and diffraction, which are the two most important disturbances to SRF. International Journal of Aerospace Engineering here as they are relatively independent from the instrument’s intrinsic dispersion properties
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