Simulation Analysis of Really Occurred Accident Caused by Short Circuit Failure of Blocking Diode and Bypass Circuit in the Photovoltaics System

Norio Ishikura,Toshiyuki Hamada,Tomoki Okamoto,Shinichiro Oke,Ikuo Nanno,Masayuki Fujii

doi:10.1109/icrera.2018.8566896

Simulation Analysis of Really Occurred Accident Caused by Short Circuit Failure of Blocking Diode and Bypass Circuit in the Photovoltaics System

Norio Ishikura, Toshiyuki Hamada + Show 4 more

https://doi.org/10.1109/icrera.2018.8566896

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Publication Date: Oct 1, 2018

Citations: 21

Affiliation: National Institute of Technology, Yonago College, National Institute of Technology, Ube College, National Institute of Technology, Tsuyama College, National Institute of Technology, Oshima College

#Blocking Diode #Bypass Diode + Show 8 more

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Abstract

In Photovoltaic Systems (PVSs), Bypass Diode (BPD) and Blocking Diode (BLD) are used. However, if BPD and BLD are damaged by induced lightning, the diodes’ impedance may become less than 10Ω. The currents generated by a normal string flow to a string which includes damaged BPD and BLD, and may generate heat and born out. In this paper, we investigate the cause of the accident due to BPD and BLD simultaneous breakdown actually occurred in Japan using computer simulation. The simulation results confirmed that the cause of the accident is damaged BPC and BLD. Moreover, we confirmed that the highest risk lies in the situation where PV panels are cut off from power conditioners while generating electricity.

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