Simulated Life Test Plans with Type-I Interval Censoring for the Gamma Lifetime Model

Abstract

Most of the existing life test plans are developed under continuous inspection of the test items. However, a reduction in testing effort can be achieved by employing the Type-I interval censored test so that the practitioners can inspect items at some certain times easily. Suppose that the lifetime distribution of a collection of items is gamma, both producer and consumer risks are considered to develop the simulated life test plans under the Type-I interval censored test with grouped data. Some of the proposed life test plans are tabulated and the use of the tables is illustrated by an example. Compared with the life test plans given by Lu and Tsai [8], improvement over the existing methods can be achieved if the simulated life test plans are used to determine the acceptability of the items, moreover, the proposed life test plans are easy to be constructed in this article.