SIMS Study of C, O and N Impurity Contamination for Multi-Crystalline Si Solar Cells

Abstract

AbstractThis paper is a case study of using SIMS to quantitatively measure C, O and N impurity contamination at two sequential commercial process steps: (1) Si feedstock: 7N (modified Siemens) and 5N feedstock (UMG-Si); and (2) multi-crystalline (mc-Si) solar wafers: cut and etched, from directional solidification bricks grown from 7N and 7N/5N (80:20) feedstock. The conclusion of this study is twofold: (a) the primary opportunity to reduce C, O and N contamination in mc-Si solar cells is at the directional solidification process, and (b) the costly specification of highly pure Si feedstock is unnecessary from a C, O and N perspective if a directional solidification process is used.