SIMS Lab Potsdam: Secondary Ion Mass Spectrometry Laboratory Potsdam

Michael Wiedenbeck,Robert Trumbull,Frédéric Couffignal,Alexander Rocholl

doi:10.17815/jlsrf-2-134

Abstract

Secondary Ion Mass Spectrometry (SIMS) is among the most powerful laboratory tools available to the analytical geochemist. Its strength lies in SIMS’ ability to produce high precision trace element and isotope ratio data on sample masses as small as 100 picograms. The Helmholtz-Centre Potsdam GFZ German Research Centre for Geosciences operates a fully equipped, large geometry SIMS instrument, which is supported by a comprehensive spectrum of peripheral instrumentation. This facility operates as an open user facility which supports the needs of the global geochemical community.

Highlights

A secondary ion mass spectrometer (SIMS) uses a nely focused ion beam to probe a selected sample domain on the polished surface of a solid material
The Helmholtz-Centre Potsdam GFZ German Research Centre for Geosciences operates a fully equipped, large geometry Secondary Ion Mass Spectrometry (SIMS) instrument, which is supported by a comprehensive spectrum of peripheral instrumentation
In the case of Potsdam’s large geometry instrument, the typical diameters for such probe beams are in the range of 2 to 30 μm

Summary

Introduction

A secondary ion mass spectrometer (SIMS) uses a nely focused ion beam to probe a selected sample domain on the polished surface of a solid material. A small percentage of the material eroded from the polished surface of the sample is ionized, and these ions are accelerated into a mass spectrometer where they are separated according to their mass-over-charge ratio. An important characteristic of SIMS is its high sensitivity compared to other microbeam sampling techniques: the ability to count individual ions results in detection limits in the 10’s of ng/g range for many elements. The fact that ions derived from the sample are separated by their mass-over-charge ratio allows high precision isotopic analyses to be performed on test portion masses that can be as small as 150 picograms. Operating either in microscope or in scanning ion imaging mode, the CAMECA 1280-HR instrument can determine elemental and isotopic maps at a ∼ 2 μm spatial resolution

The Potsdam SIMS User Facility

Instrumentation and Upgrades

Within-Laboratory Peripheral Instrumentation and Upgrades

Instrumentation available on Campus

Applications

The Helmholtz SIMS Network