Abstract
We introduce an approach aimed at prescreening COTS components according to their single-event effect (SEE) sensitivity for space missions in which a complete characterization of their individual response to protons and heavy ions is not feasible due to cost and time constraints. The method is applied to a set of SRAM memories for single-event upset (SEU) and single-event latchup (SEL) and the resulting expected SEE rates are compared with traditional approaches and in-flight data for a low-earth orbit polar and a geostationary orbit. Despite the limitations related to components with high-LET threshold and thick sensitive volumes, we conclude that the proposed method can be an efficient means of rejecting highly sensitive components or lots and performing the complete characterization only on passing devices.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
