Abstract

In this paper, the simplified prism vector (SPV) basis functions in hybrid volume-surface integral equation (VSIE) is applied to calculate the far filed and near field from planar thin dielectric structures. For the thin dielectric layers, the SPV basis functions make the volume integrals simplify into line integrals and surface integrals in volume integral equation (VIE). The computational efficiency is considerably improved in comparison with conventional VIE, while the solution accuracy is comparable for the far field and near field. In addition, the prism elements are quite suitable for planar structures. For the conductors, the RWG basis functions are utilized in surface integral equation (SIE). Several numerical examples are show to validate the accuracy and efficiency of presented method for far field and near field situations.

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