Abstract
Various means may be used to improve the detectability of an x-ray diffractometer, such as using pulse-height selection, etc. One method of increasing detectability is that of using a helium path instead of an air path for the x-rays. A graph comparing the detectability of diffraction-line intensities in a helium path to that in an air path for various wavelengths is given in Fig. 1. Chromium K alpha (CrKα) radiation is used for greater dispersion of large d spacings such as are encountered in many organic compounds.
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