Abstract
The extended Jones matrix method is applied for determination of the transmission and reflection matrices for a normally incident plane wave upon an homogeneous and lossless biaxial thin layer. The elements of these matrices are expressed by simple analytical relations. By using these relations one can express analytically the polarization-dependent optical parameters to be determined by generalized ellipsometry.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
