Abstract
The equivalent properties of a symmetric three-layer structure are derived by a nontraditional method that provides useful insights and a simplified application to some thin-film design problems. The equations derived from this method may be used to design a three-layer replacement for a single layer in an interference coating. The equations are especially helpful for cases that involve complex numbers, such as metal layers or above-critical angle propagation in dielectric layers. Several multilayer design problems are solved to demonstrate the application of this approach.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.