SIMION study of the fringing field effects in deflector-type electrostatic electron energy analyzers: A new flexible Jost-based correction scheme

Abstract

The common use of physical stops (such as slits and apertures) at the entrance and exit planes of a deflector-type electrostatic electron energy analyzer often introduces unwanted distortions in the ‘‘ideal’’ equipotential distribution and reduces the deflection angle. Since Herzog’s classic work on the fringing field correction, a variety of correction schemes have been devised. Most of these correction methods are not entirely satisfactory particularly for applications that require the use of position sensitive detectors (PSDs). In the present work, we investigate the effects of physical stops and Jost plates on the fringing field in a standard hemispherical energy analyzer by using the electron ray-tracing simulation program SIMION. By balancing the fringing field effect due to the physical stops with that of the Jost plates, we extend the correction scheme proposed earlier by Jost. The present correction scheme has the advantages of ease of construction and compatibility with PSDs.