Abstract
Optical spectroscopic characterization of silica layers containing silicon nanocrystals (Si-nc) is described in detail. Red- NIR photoluminescence (PL) is studied and correlations of the PL with optical and structural properties are analyzed. The surface mechanism of PL involving Si=O bonds is supported by our results. Wavelength-selective optical waveguiding by Si-nc/SiO<sub>2</sub> layers is studied. The found spectral filtering allows optical properties of Si-nc/SiO<sub>2</sub> layers to be measured. Laser-induced thermal effects on structural and optical properties of free-standing Si-nc/SiO<sub>2</sub> films are reported. The obtained results suggest very efficient Si-SiO<sub>2</sub> phase separation by intense laser light. Laser-controlled stress of Si-nc in silica is demonstrated. The laser manipulations with Si-nc stress offer an approach to Si-nc memory with an extremely long retention time, which can be written, read, and erased by optical means.
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