Silicon drift detector – the key to new experiments

Abstract

Originally designed as position-sensitive detectors for particle tracking, silicon drift detectors are nowadays used for high-count-rate X-ray spectroscopy, operating close to room temperature. Due to their low-capacitance read-node concept, they are among the fastest high-resolution detector systems. They have opened a new spectrum of experiments in the wide field of X-ray spectroscopy: fluorescent analysis, diffractometry, material analysis, synchrotron experiments and X-ray holography. In addition, the detection of visible light, near-infrared light and UV light is measured with high efficiency. The low-noise readout of the light of scintillation crystals extends the spectrum of possiblities to the hard X- and gamma-ray spectrum. The fact that the detector system can be used at room temperature with good spectroscopic performance, and at –10°C with excellent energy resolution, avoiding liquid nitrogen for cooling and high-quality vacuum, guarantees a large variety of new applications, independent of the laboratory environment. A brief description of the device principles is followed by basics on low-noise amplification. The performance figures of a complete detector system are presented along with some already realized dedicated applications, with emphasis on a recently operated “mini-spectrometer” for the analysis of works of art.