Abstract
Hot‐pressed yttrium disilicate ceramics have been characterized using analytical transmission electron microscopy (TEM). The microstructure consists of large grains of the γ phase of stoichiometric γ‐Y2Si2O7 containing rounded glassy Y‐doped SiO2 inclusions; excess glassy SiO2‐rich material is also found at the grain boundaries. Two main reasons are found for the inhomogeneity: a slight SiO2 excess is inferred from the composition measurements, and the LiF flux used in hot pressing would also promote glass formation. Improved high‐temperature mechanical properties would only be possible if residual glass formation was minimized, strategies for doing so are discussed, and the importance of analytical TEM for studying such submicron scale inhomogeneity is underlined.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
