Abstract

The paper examines the inherent SiGe HBT design tradeoffs between small signal and large signal RF performance for the first time. A higher Ge content and a higher Ge gradient in the base are typically desired to reduce RF noise figure, 1/f noise, phase noise, and to improve f/sub T//f/sub max/. This, however, requires the use of less Ge retrograding into the collector, which worsens high injection performance, and could degrade large signal output power and power added efficiency. Similarly, the use of a high breakdown voltage device for a higher output voltage swing could inadvertently hurt large signal output power because of a decreased current handling capability. Measurements on 200 GHz peak f/sub T/ HBTs show that excellent large signal output power and power added efficiency can be achieved for 20 GHz operation, despite the inevitable breakdown voltage decrease with scaling.

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