Abstract
Solution-processed organic field-effect transistors (OFETs) have attracted great interest due to their potential as logic devices for bendable and flexible electronics. In relation to n-channel structures, soluble fullerene semiconductors have been widely studied. However, they have not yet met the essential requirements for commercialization, primarily because of low charge carrier mobility, immature large-scale fabrication processes, and insufficient long-term operational stability. Interfacial engineering of the carrier-injecting source/drain (S/D) electrodes has been proposed as an effective approach to improve charge injection, leading also to overall improved device characteristics. Here, it is demonstrated that a non-conjugated neutral dipolar polymer, poly(2-ethyl-2-oxazoline) (PEOz), formed as a nanodot structure on the S/D electrodes, enhances electron mobility in n-channel OFETs using a range of soluble fullerenes. Overall performance is especially notable for (C60 -Ih )[5,6]fullerene (C60 ) and (C70 -D5h(6) )[5,6]fullerene (C70 ) blend films, with an increase from 0.1 to 2.1 cm2 V-1 s-1 . The high relative mobility and eighteen-fold improvement are attributed not only to the anticipated reduction in S/D electrode work function but also to the beneficial effects of PEOz on the formation of a face-centered-cubic C60 :C70 co-crystal structure within the blend films.
Highlights
Figure S11. 1D profiles for C60:C70 co-crystals on a PEOz (2) interlayer in the (a) out-ofplane (OOP) and (b) in-plane (IP) directions. (c) Joint committee on powder diffraction standards- international centre for diffraction data (JCPDS-ICDD) powder diffraction file (PDF) for the C60 and C70 standard [C60 for PDF#43-0995 and C70 for PDF#48-1206]
Significant Performance Improvement in n-Channel Organic Field-Effect Transistors with C60:C70 Co-Crystals Induced by Poly(2-ethyl-2-oxazoline) Nanodots Sungho Nam, Dongyoon Khim, Gerardo T
VTH (V) 31.54 ±5.94 30.21 ±5.12 27.45 ±4.32 28.78 ±5.51 28.91 ±3.79 24.45 ±1.79 36.42 ±2.13 38.01 ±2.99 31.01 ±5.94 23.67 ±7.45 26.87 ±7.34 27.22 ±4.81 40.04 ±3.52 17.45 ±5.61 11.65 ±5.69 19.97 ±4.57 21.83 ±4.06 32.75 ±5.52 25.65 ±4.17 25.34 ±5.48 26.34 ±2.05 24.95 ±3.46 10.45 ±0.40 6.86 ±0.72 6.23 ±1.32 7.02 ±1.24 -24.79 ±2.39 45.22 ±3.21 -25.35 ±3.09 42.68 ±3.47 μsat
Summary
Figure S11. 1D profiles for C60:C70 co-crystals on a PEOz (2) interlayer in the (a) out-ofplane (OOP) and (b) in-plane (IP) directions. (c) Joint committee on powder diffraction standards- international centre for diffraction data (JCPDS-ICDD) powder diffraction file (PDF) for the C60 and C70 standard [C60 for PDF#43-0995 and C70 for PDF#48-1206].
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.