Signature of spin reorientation in dielectric and magnetic properties of Nd0.5Dy0.5FeO3 thin films

Abstract

We present an analysis of the thin film Nd0.5Dy0.5FeO3/Si, focusing on its spin reorientation, dielectric, and magnetic characteristics. Exploring spin reorientation involves assessing dielectric and magnetic attributes across temperatures ranging from 2 to 300 K, at different applied frequencies. At temperatures between 34 and 24 K, a spin reorientation phenomenon is observed at a frequency of 10 kHz. As the applied frequency increases, the region of spin reorientation shifts towards higher temperatures. At 2 MHz, this region shifts to the temperature range from 30 to 45 K. This behaviour of the spin reorientation and shift in the spin reorientation region is further validated by AC Susceptibility data. By examining the magnetic order within the antiferromagnetic thin film, this study introduces an innovative approach to magnetic order investigation using dielectric properties.