Abstract
Greek potteries have been analysed using Rutherford backscattering of 4He + of 1.8 MeV energy. Information about the surface composition and the depth distribution of various elements has been obtained. The same samples have been studied by using X-ray fluorescence induced by X-rays emitted from a Moanode bombarded with 50 keV electrons. The techniques appear to be fully complementary. The comparison between their results allows a better and unambiguous characterization of the samples. Moreover such characterization techniques may be used also in different fields as chemistry, geology and agricultural science.
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