Abstract
We report the results of a beam test at KEK using double-sided AC-coupled silicon microstrip detectors with binary readout, i.e., a readout where the signals are discriminated in the front-end electronics and only the hit location as kept. For strip pitch between 50/spl mu/ and 200/spl mu/, we determine the efficiency and the noise background as function of threshold setting. This allows us to reconstruct the Landau pulse height spectrum and determine the signal/noise ratio. In addition, the threshold/noise ratio necessary for operation with low occupancy is determined. >
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
