Sidewall profile control of thick benzocyclobutene reactively ion etched in CF4∕O2 plasmas

Abstract

The feasibility of controlling the sidewall angle of thick benzocyclobutene (BCB) etched in a CF4∕O2 plasma using thick photoresist as an etch mask has been investigated. Sidewall angle, BCB etch rate, and BCB to photoresist selectivity as functions of chamber pressure and CF4 to O2 ratios are reported. Through the use of postdeveloped reflown photoresist, an optimum sidewall angle of less than 60° was achieved at 33mT chamber pressure and a 19% CF4∕O2 ratio. The method presented here achieves deep, residue-free etching of thick BCB with a sidewall profile suitable for e-beam evaporated and lifted metal for use in vertical interconnects.