Side Channel Leakage Information Based on Electromagnetic Emission of STM32 Micro-controller

Abstract

This paper analyses the electromagnetic information conducted leakage mechanism of a typical single-chip microcontroller, tests and reconstructs raw information emission by micro-controllers. The direct-coupled signal detection method is used to collect the electromagnetic leakage information of the side channel to obtain the conduction coupling leakage waveform. Using the wavelet transform, feature information of the leakage signal is extracted. And the original information is reconstructed by using Support Vector Machine (SVM). The results show that the chip-level electromagnetic emission leakage is closely related to its working state, and the side channel is used to detect and analyze the leakage signal, which can reconstruct the original information and effectively know its internal working state.