Abstract

The concept of third-generation photovoltaics is to significantly increase device efficiencies whilst still using thin-film processes and abundant non-toxic materials. A strong potential approach is to fabricate tandem cells using thin-film deposition that can optimise collection of energy in a series of cells with decreasing band gap stacked on top of each other. Quantum dot materials, in which Si quantum dots (QDs) are embedded in a dielectric matrix, offer the potential to tune the effective band gap, through quantum confinement, and allow fabrication of optimised tandem solar cell devices in one growth run in a thin-film process. Such cells can be fabricated by sputtering of thin layers of silicon rich oxide sandwiched between a stoichiometric oxide that on annealing crystallise to form Si QDs of uniform and controllable size. For approximately 2-nm diameter QDs, these result in an effective band gap of 1.8 eV. Introduction of phosphorous or boron during the growth of the multilayers results in doping and a rectifying junction, which demonstrates photovoltaic behaviour with an open circuit voltage (VOC) of almost 500 mV. However, the doping behaviour of P and B in these QD materials is not well understood. A modified modulation doping model for the doping mechanisms in these materials is discussed which relies on doping of a sub-oxide region around the Si QDs.

Highlights

  • An increase in efficiency can be achieved through the use of multiple energy levels in a third-generation photovoltaic device

  • The Si quantum dot (QD) solar cell is suggested as a way to engineer the band gap (Eg) of the top cell or cells in a tandem stack using thin-film deposition methods [1,2,3]

  • Quantum confinement in Si QD nanostructures is proposed to engineer an increase in the effective band gap and produce materials suitable for upper cell elements in a thin-film tandem cell

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Summary

Introduction

An increase in efficiency can be achieved through the use of multiple energy levels in a third-generation photovoltaic device. This suggests the presence of a weakly absorbing background surrounding the crystalline Si QDs. The small dependence of absorption of this region on the Si content suggests it is a sub-stoichiometric oxide with only a very small amount of O.

Results
Conclusion

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