Abstract
Monochromatized synchrotron radiation was employed to calibrate a silicon–lithium detector in the 1–7 keV energy range. The efficiency calibration was achieved using a reference proportional counter. The absorbing layer thickness was determined by fitting theoretical efficiency functions to experimental data; the silicon “dead layer” appears to operate as a partially active layer. The peak shape calibration is established by fitting an Hypermet-type function to monochromatic photon spectra. Knowledge of the relevant shape parameters dependence on the energy allows improved processing of complex X-ray spectra.
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