Abstract
Departures from Gaussian lineshape in Si(Li) spectra arise from the radiative Auger effect, the intrinsic Lorentzian shape of X-ray emission lines, double ionization and spectator vacancy satellites, electron escape from the detector and carrier diffusion within it, and from imperfections in the charge collection process. Rather than describe empirically the tailing function that arises collectively from these effects, we prefer to incorporate those that are fundamental in nature into the lineshape model, and to reserve empirical description for the minority component that is truly an artefact reflecting imperfections in the device. A useful alternative to such a lineshape description is a weighting scheme that de-emphasises the tails of intense peaks in a least-squares fitting process.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
