Abstract
AbstractSi(Li) detector efficieneres are measured up to 100 keV photon energy in typical X‐ray fluorescence geometries using 55Fe, 109Cd, 57Co and 241Am annular sources. The targets are common chemical compounds. The photopeak yield is normalized by the use of a bare CaF2(Eu) scintillator which is free of dead layer. The scintillator response is corrected for escape peak losses. The presented method permits the detection of long term changes in detector response. Discrepancies are found in published nominal detector thicknesses.
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