Abstract
Heavily doped SiGe alloy film prepared by glow discharge decomposition has been investigated by measuring both electrical conductivity and thermoelectric power. It has been found that their electrical conductivity increases suddenly with transition from the amorphous state to the microcrystalline state (up to 250 s·cm −1), and that their thermoelectric power has an extremely large Seebeck coefficient of 160 μV/K. An examination of both X-ray diffraction and Raman scattering shows that the film is composed of the random mixing of SiSi, SiGe and GeGe bonds and volume fractions of crystallinity are estimated from 30% to 90% for highly conductive SiGe alloy film.
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