Abstract

Make-up of threaded connections generates shrink-fit interference along the engaged thread length of pin and box. Pressure on the pin-box interface, together with Poisson's ratio, shortens the box and stretches the pin, creating shear and affecting sealability. This paper presents an analytical elastic solution of make-up with linear shear to help understand the physics of make-up and the unexpected consequences on leak. The model is driven and supported by results from FEA (finite element analysis) on an example API LTC connection. The main conclusion from the analysis is that make-up shear reduces leak resistance.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.