Abstract

The dynamic spectral properties of Continuous Wave (CW) semiconductor lasers during continuous wavelength current tuning process (i.e. slope efficiency, dynamic wavelength current tuning rate and dynamic linewidth) are of utmost significance to high resolution molecular spectroscopy and trace gas detection. In this paper, a system for measuring dynamic spectral properties was setup based on a short-delayed self-heterodyne interferometry with different Optical Path Difference (OPD). And the dynamic spectral properties of different Distributed Feedback (DFB) semiconductor lasers were tested respectively by the system combined with a special time-frequency analysis method. The dynamic slope efficiency unveils nonlinear optical intensity that can’t be neglected in dealing with Residual Amplitude Modulation (RAM). The dynamic wavelength current tuning rate can be used to calibrate laser wavelength. The dynamic linewidth of a laser can be used to evaluate the spectral resolution in gas detecting. The system was demonstrated to simultaneously measure the dynamic spectral properties of different types of tunable lasers with a wavelength range in 2 μm ~ 8 μm during the tuning process. These dynamic spectral properties were distinctly different with the properties while the laser operates at a stable state, which may lay a foundation for deep research and enrichment the highly-precise spectrum database in gas sensing fields.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.