Abstract
XRD measurements have been performed on amorphous evaporated Sb 2S 3 thin films (4μm). The Radial Electron Density Distribution (REDD) has been analyzed to study the short and medium range order in thin films. The first REDD peak is satisfactorily fitted by hypothesizing the same Sb-S 3 trigonal structural units as in a-Sb 2S 3 bulk and powder samples. A qualitative analysis of the REDD beyond the first peak indicates that the medium range order is on the contrary dependent on the preparation technique.
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