Abstract
Particle & Particle Systems CharacterizationVolume 18, Issue 2 p. 107-107 Announcement Short Course on Particle Characterization From Millimeters to Nanometers 15–19 October 2001, Clausthal, Germany, 15–19 October 2001, Clausthal, GermanySearch for more papers by this author 15–19 October 2001, Clausthal, Germany, 15–19 October 2001, Clausthal, GermanySearch for more papers by this author First published: 02 August 2001 https://doi.org/10.1002/1521-4117(200107)18:2<107::AID-PPSC107>3.0.CO;2-0AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat No abstract is available for this article. Volume18, Issue2July 2001Pages 107-107 RelatedInformation
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