Sherrie Elzey and De-Hao Tsai win ABC Best Paper Award.

Abstract

Sherrie Elzey was born in 1981. She earned her B.S. degree in chemistry and B.A. degree in physics from the University of Northern Iowa (Cedar Falls, IA, USA). She received a National Defense Science and Engineering Graduate fellowship and earned her Ph.D. degree from the University of Iowa (Iowa City, IA, USA). She was then awarded a National Research Council postdoctoral fellowship at the National Institute of Standards and Technology (NIST; Gaithersburg, MD, USA). At NIST, she conducted research in the Materials Measurement Laboratory focusing on method development for measuring the size and elemental composition of representative therapeutic nanoparticles with functionalized surfaces. After her postdoctoral research, she joined TSI (Shoreview, MN, USA) as an applications engineer, where she applied a variety of sizing methods to measure airborne and liquid-phase nanoparticles. She is currently a regional sales manager at TSI. De-Hao Tsai was born in 1976. He earned a B.S. degree in chemical engineering from the National Cheng Kung University (Tainan, Taiwan) in 1998, and an M.S. degree in chemical engineering from the National Tsing Hua University (Hsinchu, Taiwan) in 2000. He received his Ph.D. degree in materials science and engineering from the University of Maryland (College Park, MD, USA) in 2007 under the supervision of Michael R. Zachariah. He is currently Assistant Professor in the Department of Chemical Engineering at NTHU. Prior to joining NTHU, he worked as a research scientist at Cabot Microelectronics (Aurora, IL, USA; 2008–2009) and as a research associate at NIST (2009–2013). During his tenure at NIST, his research work focused onmeasurements for applications in nanomedicine supervised by Vincent A. Hackley. In 2013, he received the 2013 Distinguished Associate Award for Technical Achievement at NIST to acknowledge his exemplary leadership in the development of innovative physical and chemical metrology for applications in cancer nanotechnology.