Abstract
This study aims to cross-check the same sample, the same part and the same piece by shave-off profiling and scanning transmission electron microscope (STEM) imaging. For cross-check analysis, a piece was picked up from a failed IC package which might cause electrochemical migration. Critical disagreement on each result was gradient curve on shave-off depth profiling from anode to cathode. In the same piece, shave-off profiling visualized a faint gradient of migrated ions which could not be observed by STEM imaging.
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