Abstract
Fault simulation is a critical tool in design, analysis of testability and verification of circuits. BDDs are a well-known model for manipulating Boolean functions. We propose a new type of BDD in the form of Shared Structurally Synthesized BDD (S3BDD) for representing the structure and simulating of faults in digital circuits. The paper offers a formula for calculating the minimal size, a method for synthesis of S3BDDs and a method for parallel pattern simulation with S3BDDs. We demonstrate a considerable increase in the speed-up of simulation of digital circuits using S3BDDs
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