Abstract

Deep subwavelength localization and displacement sensing of optical nanoantennas have emerged as extensively pursued objectives in nanometrology, where focused beams serve as high-precision optical...

Highlights

  • Deep subwavelength localization and displacement sensing of optical nanoantennas have emerged as extensively pursued objectives in nanometrology, where focused beams serve as high-precision optical rulers while the scattered light provides an optical readout

  • The latter implies that the far-field sensitivity to displacements of a nanoantenna may be enhanced by tailoring the spatial derivatives of the excitation field

  • A polarization-tailored beam is focused by a microscope objective (MO1) with the numerical aperture NA1 onto a nanoantenna positioned in the focal plane

Read more

Summary

■ DISCUSSION AND CONCLUSION

We have considered a subwavelength localization and displacement sensing scheme that is based on the positiondependent scattering response of optical nanoantennas excited with structured light beams. We would like to note a similarity between our approach to enhance the displacement sensitivity and the quantum weak measurements inspired[48,49] polarization filtering techniques, typically employed to enhance the visibility of beam shift phenomena.[50−53] In the context of classical optics, a “weak measurement” with pre- and postselected state vectors consists of performing a measurement in which polarization weakly couples to other degrees of freedom using two almost orthogonal input and output polarizations states.[54−58] Only recently have these techniques expanded to the realm of nanooptics and nanophotonics,[23,24,59] for which an analogy was put forward.[24] in our case, a superposition of azimuthal polarization with a small fraction of radial polarization and the selective response of the electric-dipole nanoantenna to the focal electric field created mostly by the radial component near the optical axis can be regarded as pre- and postselection, respectively.

■ REFERENCES
Phase Estimation with Weak Measurement Using a White Light

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.