Abstract
We use the scanning-electron-microscope–electron-backscattering diffraction (SEM-EBSD), atomic force microscopy (AFM), and calculations based on the phenomenological theory of martensite crystallography (PTMC) to study two types of martensite observed in ceria-doped zirconia. The results indicate that a plate-type martensite has various habit planes such as {301}t, {100}t, and {10 1 0}t, which suggests the association of different lattice correspondences and lattice-invariant shears in PTMC. A pyramid-type martensite has only {301}t habit plane. The shape strains of the variants associated with these habit planes are effective in accommodating the shape strains of the transformation in the near-surface region, as proposed by Deville et al. (2004). Although pyramidal structures appear predominantly on surfaces near the (001)t plane, they also appear on surfaces near (100)t and (010)t planes. These results are understood from the shape strains calculated by the PTMC.
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