Abstract
We have applied the total photoelectron yield method on ferritic-iron surface to measure the EXAFS of the natural oxide layer at the Frascati Synchrotron Radiation facility (PULS). We have found that the oxide contribution to the spectrum is relevant at low values of photoelectron wavevector k. The Fe O distance d = 2.04 A has been determined. The effective sampling depth of the total yield mode at ≅ 7 keV has been found. The energy dependence of the sampling depth of total yield in the X-ray range from 1.5 to 9 keV is found to increase with photoenergy.
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