Abstract
SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor: Sexton, F W, Corbett, W T, Treece, R K, Hass, K J, Hughes, K L, Axness, C L, Hash, G L, Shaneyfelt, M R and Wunsch, T FIEEE Trans. Nucl. Sci. Vol 38 No 6 pt 1 (December 1991) pp 1521–1528
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callSimilar Papers
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
