Abstract
With device dimensions in the nanometer regime, variability is now a serious concern in LSI design. Aggressive scaling, along with ever increasing technology complexity, leads to an explosion in the magnitude of variability while also introducing new sources of variability that need to be characterized and modeled. The topic of this session, statistical modeling of performance variability and circuit reliability, is therefore one of key challenges for achieving robust design of LSIs.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
