Abstract
In this study, the albedo parameters are known as the reflectance capacity of the electromagnetic radiation falling on the target samples; the surface's reflectivity was investigated. For this purpose, in the experimental setup, 241Am as a radioactive source and a semiconductor detector were used to count the scattered photons due to reflecting the gamma rays radiating from the source. The data obtained from the experiment were plotted depending on the atomic number of the target samples. It is understood from this study that the albedo factor parameters of the target samples selected for research decrease with increasing average atomic number.
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