Sequential Sampling Plan for Timing Initial Fungicide Application to Control Botrytis Leaf Blight of Onion

Abstract

Vincelli, P. C., and Lorbeer, J. W. 1987. Sequential sampling plan for timing initial fungicide application to control Botrytis leaf blight of onion. Phytopathology 77:1301-1303. A sequential sampling plan (SSP) that optimizes sampling intensity for levels (M), where yu ranged from 0.2 to 1.8 lesions per leaf at 0.2 lesion per determining disease levels of Botrytis leaf blight in onion fields was leaf increments. For y > 1.0 and 1.4 lesions to 50 computer-simulated lesion counts representing sequentially sampled per leaf, conclusions were generally reached after sampling 15-35 plants, plants until it was concluded that the disease level was either above or below thereby reducing sampling intensity from the current 50 plants. Similar the CDL. Five hundred conclusions were tested at each of nine disease results were obtained with field data. Botrytis leaf blight of onion (Allium cepa L.), caused by Botrytis were made during the 1986 season. The fields sampled were up to 2