Sequential multi-element analysis of sediments and soils by inductively-coupled plasma/atomic emission spectrometry with a computer-controlled rapid-scanning echelle monochromator

Abstract

A computer-controlled rapid-scanning echelle monochromator is used to determine the major, minor and trace elements in reference sediments and soils. The high resolving power of the echelle spectrometer effectively decreases line overlap interferences, and permits a wide selection of analytical lines to be used. The concentrations of 17 elements in five standard materials are determined by using a single set of analytical lines without any corrections for line overlap interferences. Averages of relative standard deviations and relative deviations from the certified values for the 17 elements range from 2.4 to 4.3% and from 1 to 5%, respectively.