Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions

Abstract

The total secondary electron emission yields, γT, induced by impact of the fast ions Neq+ (q=2–8) and Arq+ (q=3–12) on Si and Neq+ (q=2–8) on W targets have been measured. It was observed that for a given impact energy, γT increases with the charge of projectile ion. By plotting γT as a function of the total potential energy of the respective ion, true kinetic and potential electron yields have been obtained. Potential electron yield was proportional to the total potential energy of the projectile ion. However, decrease in potential electron yield with increasing kinetic energy of Neq+ impact on Si and W was observed. This decrease in potential electron yield with kinetic energy of the ion was more pronounced for the projectile ions having higher charge states. Moreover, kinetic electron yield to energy-loss ratio for various ion-target combinations was calculated and results were in good agreement with semi-empirical model for kinetic electron emission.